1400D SURFCOM
1400D SURFCOM
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AI Function Simplifies Measurements (Patented)
The unit automatically selects the measuring conditions without setting them in advance (roughness measurement). -
Automation Enhances Measurement Efficiency
The teaching function can be used to automate a series of operations, from measurement at multiple locations to generation of an inspection report by pasting the data. -
Evaluation Functions Dramatically Strengthened
Reflecting customer requests for more evaluation functions, this unit includes standards for film thickness measurement (step/area), wear volume calculation (superimposed profile area) and LCD glass substrate (special waviness). -
Complies with World Standards
Support ISO, JIS, DIN, ASME, CNOMO and other standards. -
Freedom to Re-Analyze
Re-analysis can be performed easily after changing the measurement standard (linear, first half, latter half, round surface, both end), configuring the evaluation range, and removing defective data from a notch.
Item / Model | SURFCOM 1400D-12 | ||
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Measuring range | Z axis (vertical) | 800µm | |
X axis (horizontal) | 100mm | ||
Vertical recording magnification | 50 to 500K times, automatic | ||
Horizontal recording magnification | 1 to 20K times, automatic | ||
Measuring force | 0.7 mN | ||
Straightness accuracy | 0.05+1.5L/1000µm | ||
Measuring rate | 0.03 to 6mm/s (8 speeds) | ||
Miscellaneous | Power supply | AC110V、60Hz | |
Power consumption | 280VA | ||
Installation size (W x D x H) | 1500 × 550 × 750mm | ||
Weight | 120Kg |
-
AI Function Simplifies Measurements (Patented)
The unit automatically selects the measuring conditions without setting them in advance (roughness measurement). -
Automation Enhances Measurement Efficiency
The teaching function can be used to automate a series of operations, from measurement at multiple locations to generation of an inspection report by pasting the data. -
Evaluation Functions Dramatically Strengthened
Reflecting customer requests for more evaluation functions, this unit includes standards for film thickness measurement (step/area), wear volume calculation (superimposed profile area) and LCD glass substrate (special waviness). -
Complies with World Standards
Support ISO, JIS, DIN, ASME, CNOMO and other standards. -
Freedom to Re-Analyze
Re-analysis can be performed easily after changing the measurement standard (linear, first half, latter half, round surface, both end), configuring the evaluation range, and removing defective data from a notch.